Skaneeriv elektronmikroskoop: erinevus redaktsioonide vahel
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<ref name="vonardenne">von Ardenne M. [http://worldwide.espacenet.com/publicationDetails/biblio?CC=GB&NR=511204&KC=&FT=E&locale=en_EP Improvements in electron microscopes]</ref>
<ref name="Scientific Imaging Group">[http://www2.eng.cam.ac.uk/~bcb/semhist.htm 50 Years of Research and Development]</ref>
<ref name="Broers">{{cite journal |last=Broers |first=A.N. |year=1991 |title=Electron gun using long-life LaB6 cathode |journal=
<ref name="TEM">David B. Williams, C. Barry Carter "Transmission electron microscopy. A Textbook for Materials Science" Springer, 2009, lk 77-81</ref>
<ref name="Haine">{{cite journal |last=Haine, Einstein |year=1952 |title=Characteristics of the hot cathode electron microscope gun |journal=
<ref name="YYGBj">[[Väino Sammelselg]]: [http://www.fi.tartu.ee/~kiku/Loeng_14_SEM.pdf Skaneeriv elektronmikroskoopia (SEM)]</ref>
<ref name="Reimer">Reimer, Ludwig. "Scanning Electron Microscopy: Physics of Image Formation and Microanalysis", Springer, 1985, Berlin</ref>
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